Microstructure effects in the X-ray powder diffraction profile of 9 mol% Mg-PSZ

被引:6
作者
Cumbrera, FL
Sanchez-Bajo, F
Fernández, R
Llanes, L
机构
[1] Univ Extremadura, Dept Fis, Fac Ciencias, E-06071 Badajoz, Spain
[2] Univ Extremadura, Dept Elect & Ingn Electromecan, Escuela Ingn Ind, Badajoz, Spain
[3] UPC, Dept Ciencia Mat & Ingn Met, ETSIIB, Barcelona 08028, Spain
关键词
D O I
10.1016/S0955-2219(98)00112-5
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The relative abundances of the polymorphs present in samples of 9 mol% magnesia-partially stabilized zirconia (Mg-PSZ) have been determined by Rietveld analysis of X-ray powder determined action data. The composition of the samples is mainly dominated by the tetragonal content. Preferred orientation and anisotropic line broadening effects on this majority phase were observed. It is shown that the consideration of these microstructural effects during the Rietveld refinement is not only important with the aim of improving the refinement but also indispensable to obtain the accurate proportion of the phases. (C) 1998 Elsevier Science Limited. All rights reserved.
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收藏
页码:2247 / 2252
页数:6
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