Surface engineering along the close-packed direction of SrTiO3

被引:22
作者
Doan, TD [1 ]
Giocondi, JL [1 ]
Rohrer, GS [1 ]
Salvador, PA [1 ]
机构
[1] Carnegie Mellon Univ, Dept Mat Sci & Engn, Pittsburgh, PA 15213 USA
关键词
atomic force microscopy; substrates; surfaces; oxides; perovskites;
D O I
10.1016/S0022-0248(01)00829-6
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
We have investigated the effects of wet etching with a 3:1 mixture of HCl:HNO3 and of annealing at 850 degreesC on the surface morphology of [1 1 1]-oriented SrTiO3 single crystals. Atomic force microscopy is used to demonstrate that the surface morphology is a strong function of both etching and annealing time. All surfaces have step heights equal to integral or half-integral multiples of the (1 1 1) interplanar spacing. However, step bunching, non-regular step heights, granularity, inhomogeneous surface morphology, and etch pits are observed on many surfaces. A combination of etching and annealing leads to surfaces that are free of these irregularities and are characterized by well-developed step-terrace structures: the terraces are approximate to 600 Angstrom wide, the step heights are either 1.2 Angstrom or 2.3 Angstrom, which are a half or a whole (1 1 1) interplanar distance, respectively, and the step edges are parallel to a single <1 1 0 > -type direction. The existence of these two step heights implies that the surfaces are terminated by both SrO3 and Ti planes. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:178 / 182
页数:5
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