A monochromator for scanning X-ray microscopy beamlines at third-generation synchrotron light sources

被引：6

作者：

vonBrenndorff, AI

Niemann, B

Rudolph, D

Schmahl, G

机构：

来源：

JOURNAL OF SYNCHROTRON RADIATION | 1996年 / 3卷

关键词：

monochromators; X-ray microscopy; beamline design; third-generation synchrotron light sources;

D O I：

10.1107/S0909049596004529

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A concept for a plane-grating monochromator for use at scanning X-ray microscopy beamlines at third-generation synchrotron light sources is presented. The design of the monochromator is optimized for a scanning transmission X-ray microscopy beamline at BESSY II. Ray-tracing calculations are presented which include geometric aberrations of the optics used in the beamline.

引用

页码：197 / 198

页数：2