Performances of various types of benders for sagittally focusing crystals on ESRF synchrotron beamlines

被引：15

作者：

Freund, AK ^{[1
]}

Comin, F ^{[1
]}

Hazemann, JL ^{[1
]}

Hustache, R ^{[1
]}

Jenninger, B ^{[1
]}

Lieb, K ^{[1
]}

Pierre, M ^{[1
]}

机构：

[1] European Synchrotron Radiat Facil, F-38043 Grenoble, France

来源：

CRYSTAL AND MULTILAYER OPTICS | 1998年 / 3448卷

关键词：

synchrotron; x-ray; optics; focusing; crystals;

D O I：

10.1117/12.332501

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Different types of crystal bending devices have been developed at the ESRF in the past few years for sagittal focusing of relatively wide bending magnet and wiggler synchrotron x-ray beams and of more tightly collimated undulator radiation. Their basic features and performances are presented, together with practical experience. A new bender for dynamical microfocusing of undulator beams down to micrometer spatial resolution with high efficiency is described.

引用

页码：144 / 155

页数：12

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