A statistical approach to the inspection checklist formal synthesis and improvement

被引:29
作者
Chernak, Y
机构
[1] IEEE Computer Society, Hackensack
[2] Hackensack, NJ 07601., 25 Zabriskie St.
关键词
defect causal analysis; defect modeling; inspection checklist; software inspection; software testing;
D O I
10.1109/32.553635
中图分类号
TP31 [计算机软件];
学科分类号
081202 ; 0835 ;
摘要
This paper proposes a statistical approach to the inspection checklist formal synthesis and improvement. The approach is based on a defect casual analysis and defect modeling. The defect model is developed using IBM's Orthogonal Defect Classification. The case study describes the steps and tool for the approach implementation. The advantages and disadvantages of both methods-empirical and statistical-are discussed and compared. It is suggested that a statistical approach be used in conjunction with the empirical approach. The main advantage of the proposed technique is that it allows us to tune a checklist according to the most recent project experience and identify optimal checklist items even when a source document does not exist.
引用
收藏
页码:866 / 874
页数:9
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