Effect of Pr3+ doping on the OH content of silica xerogels

被引：20

作者：

Armellini, C

Del Longo, L

Ferrari, M

Montagna, M

Pucker, G

Sagoo, P

机构：

[1] CNR, CeFSA, I-38050 Trent, Italy

[2] Univ Trent, Dipartimento Fis, INFM, I-38050 Trent, Italy

来源：

JOURNAL OF SOL-GEL SCIENCE AND TECHNOLOGY | 1998年 / 13卷 / 1-3期

关键词：

silica xerogel; Pr3+; OH contents; luminescence;

D O I：

10.1023/A:1008699412259

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Pr2O3-SiO2 xerogels doped with different Pr/Si concentrations were annealed at 900 degrees C for 120 h and then investigated by FTIR, NIR absorption, Raman and luminescence spectroscopies. It is observed that the content of surface silanol groups is lower for higher Pr3+ concentrations. Luminescence measurements indicate that the amount of the residual OH plays an important role in the spectroscopic properties of the Pr3+ ion and in particular the quantum yield of the emission from the P-3(0.01) and D-1(2) states.

引用

页码：599 / 603

页数：5

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