A self-consistent full 3-D real-space NEGF simulator for studying nonperturbative effects in nano-MOSFETs

被引:125
作者
Martinez, Antonio [1 ]
Bescond, Marc
Barker, John R.
Svizhenko, Alexei
Anantram, M. P.
Millar, Campbell
Asenov, Asen
机构
[1] Univ Glasgow, Dept Elect & Elect Engn, Glasgow G12 8LT, Lanark, Scotland
[2] MINATEC, Inst Microelect Electromagnetisme & Photon IMEP, F-38016 Grenoble 1, France
[3] SILVACO Int, Santa Clara, CA 95054 USA
[4] Univ Waterloo, Dept Elect & Comp Engn, Waterloo, ON N2L 3G1, Canada
基金
英国工程与自然科学研究理事会;
关键词
nanowire MOSFET; nonequilibrium green function (NEGF); stray charges; surface roughness;
D O I
10.1109/TED.2007.902867
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 [电气工程]; 0809 [电子科学与技术];
摘要
In this paper, we present a full 3-D real-space quantum-transport simulator based on the Green's function formalism developed to study nonperturbative effects in ballistic nanotransistors. The nonequilibrium Green function (NEGF) equations in the effective mass approximation are discretized using the control-volume approach and solved self-consistently with the Poisson equation in order to obtain the electron and current densities. An efficient recursive algorithm is used in order to avoid the computation of the full Green function matrix. This algorithm, and the parallelization scheme used for the energy cycle, allow us to compute very efficiently the current-voltage characteristic without the simplifying assumptions often used in other quantum-transport simulations. We have applied our simulator to study the effect of surface roughness and stray charge on the I-D-V-G characteristic of a 6-nm Si-nanowire transistor. The results highlight the distinctly 3-D character of the electron transport, which cannot be accurately captured by using 1-D and 2-D NEGF simulations, or 3-D mode-space approximations.
引用
收藏
页码:2213 / 2222
页数:10
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