Interface roughness in Fe(100)/Cr film structures studied by CEMS

被引：44

作者：

Klinkhammer, F ^{[1
]}

Sauer, C ^{[1
]}

Tsymbal, EY ^{[1
]}

Handschuh, S ^{[1
]}

Leng, Q ^{[1
]}

Zinn, W ^{[1
]}

机构：

[1] FORSCHUNGSZENTRUM JULICH, FORSCHUNGSZENTRUM, INST FESTKORPERFORSCH, D-52425 JULICH, GERMANY

来源：

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 1996年 / 161卷

关键词：

Mossbauer effect; CEMS; interface roughness; Fe(100)/Cr; layered structures;

D O I：

10.1016/S0304-8853(96)00063-7

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Various epitaxial Fe(100)/Cr film structures were MBE-grown on MgO(100) and GaAs(100) substrates with the aim to modify the roughness of the Fe/Cr interfaces. By introducing a 2 monolayer thick Fe-57 probe layer at the interface the distribution of the magnetic hyperfine (hf) fields could be measured locally by means of Fe-57 conversion electron Mossbauer spectroscopy (GEMS). A simple model is applied which allows the determination of a pattern of the average interface roughness from this hf field distribution. It was observed that even samples of high epitaxial quality according to LEED and RHEED reveal a micro-roughness on a lateral scale of 1-2 nm due to intermixing of Fe and Cr within 1-2 monolayers.

引用

页码：49 / 56

页数：8

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