Scanning force microscopy investigation of liquid structures and its application to fundamental wetting research

被引：23

作者：

Herminghaus, S ^{[1
]}

Pompe, T

Fery, A

机构：

[1] Univ Ulm, Abt Angew Phys, D-89069 Ulm, Germany

[2] Max Planck Inst Colloids & Interfaces, D-14424 Potsdam, Germany

来源：

JOURNAL OF ADHESION SCIENCE AND TECHNOLOGY | 2000年 / 14卷 / 14期

关键词：

scanning force microscopy; wetting; line tension;

D O I：

10.1163/156856100743220

中图分类号：

TQ [化学工业];

学科分类号：

0817 ;

摘要：

The possibility of determining the topography of liquid profiles by scanning force microscopy (SFM) in tapping mode is discussed in detail as to its possible mechanism and accuracy. Applications of this technique to the investigation of contact line tensions and effective interface potentials an presented. Two complementary methods, both based on SFM of the liquid topography, are demonstrated for determining contact line tensions. The values obtained are within the theoretically expected range.

引用

收藏

页码：1767 / 1782

页数：16

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