Real-time studies during coating and post-deposition annealing in organic semiconductors

被引：11

作者：

Campoy-Quiles, M. ^{[1
]}

Schmidt, M. ^{[1
]}

Nassyrov, D. ^{[1
]}

Pena, O. ^{[1
]}

Goni, A. R. ^{[1
]}

Alonso, M. I. ^{[1
]}

Garriga, M. ^{[1
]}

机构：

[1] Inst Mat Sci Barcelona ICMAB CSIC, Bellaterra 08193, Spain

来源：

THIN SOLID FILMS | 2011年 / 519卷 / 09期

关键词：

Ellipsometry; Photometry; In-situ; Annealing; Organic semiconductors; Polymers; Photovoltaics; Dip coating; POLYMER SOLAR-CELLS; BLEND FILMS; MORPHOLOGY; CAST;

D O I：

10.1016/j.tsf.2010.12.228

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In this contribution we explore the use of real time spectroscopic probes to gain useful insights into the kinetics of semiconductor polymer chains during thin film formation and upon post-deposition annealing treatments. In-situ ellipsometry is employed to monitor the deposition of thin films of the workhorse material system for organic photovoltaics (soluble derivative fullerene blended with poly(3-hexylthiophene)), when processed from solution using an analogous dip coating deposition method. This allows for detailed time investigation of the dynamics of film formation. Moreover, we applied spectroscopic photometry to study the in-situ crystallization and diffusion of polymer chains during post-deposition solvent annealing. (C) 2011 Elsevier B.V. All rights reserved.

引用

页码：2678 / 2681

页数：4

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