Scanning optical probe microscopy with submicrometer resolution using an organic photodetector

被引：9

作者：

An, Kwang H. ^{[1
]}

O'Connor, Brendan ^{[1
]}

Pipe, Kevin P. ^{[1
]}

Zhao, Yiying ^{[2
]}

Shtein, Max ^{[2
]}

机构：

[1] Univ Michigan, Dept Mech Engn, Ann Arbor, MI 48109 USA

[2] Univ Michigan, Dept Mat Sci & Engn, Ann Arbor, MI 48109 USA

来源：

APPLIED PHYSICS LETTERS | 2008年 / 93卷 / 03期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1063/1.2963033

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A high-resolution scanning optical microscopy technique is demonstrated, in which an organic photodetector on a silicon-based scanning probe cantilever scans a sample, simultaneously recording optical and topographic data with submicrometer resolution, while showing no measurable degradation during the scan. Potential applications of the probe include characterization of optoelectronic materials and devices, as well as simultaneous topographic and fluorescence microscopy of biological samples. Extension to these applications is aided by the fact that the probe is compatible with conventional atomic force microscopy systems and does not suffer some of the practical difficulties of existing near-field scanning optical microscopy systems. (C) 2008 American Institute of Physics.

引用

页数：3

共 17 条

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