Low frequency light scattering in silica xerogels

被引：10

作者：

Fontana, A ^{[1
]}

Montagna, M

Rossi, F

Ferrari, M

Pelous, J

Terki, F

Woigner, T

机构：

[1] Univ Trent, Dipartimento Fis, I-38050 Trent, Italy

[2] Ist Nazl Fis Mat, I-38050 Trent, Italy

[3] Consiglio Nazl Ric CeFSA, Ctr Fis Stati Aggregati, I-38050 Trent, Italy

[4] Univ Montpellier 2, Lab Verres, UMR5587, F-34095 Montpellier, France

来源：

JOURNAL OF PHYSICS-CONDENSED MATTER | 1999年 / 11卷 / 10A期

关键词：

D O I：

10.1088/0953-8984/11/10A/016

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

New Brillouin and Raman scattering measurements on silica xerogels in a wide range of densities (0.5-2.2 g cm(-3)) are compared among each other and with data in melt quenched vitreous silica, in the 10-750 K temperature region. In the low frequency part of the Raman spectra, the boson peak characteristic of glasses is observed for all studied densities at tow and high temperature when the quasielastic contribution is negligible. The results provide strong evidence of the presence of water in the pores of the silica skeleton.

引用

页码：A207 / A211

页数：5

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