Estimating near-infrared leaf reflectance from leaf structural characteristics

被引:294
作者
Slaton, MR
Hunt, ER
Smith, WK
机构
[1] Wake Forest Univ, Dept Biol, Winston Salem, NC 27109 USA
[2] Univ Wyoming, Dept Bot, Laramie, WY 82071 USA
[3] USDA ARS, Beltsville Agr Res Ctr, Remote Sensing & Modeling Lab, Laurel, MD 20707 USA
关键词
A(mes)/A; bicoloration; leaf structure; mesophyll; near-infrared; reflectance;
D O I
10.2307/2657019
中图分类号
Q94 [植物学];
学科分类号
071001 ;
摘要
The relationship between near-infrared reflectance at 800 nm (NIRR) from leaves and characteristics of leaf structure known to affect photosynthesis was investigated in 48 species of alpine angiosperms. This wavelength was selected to discriminate the effects of leaf structure vs. chemical or water content on leaf reflectance. A quantitative model was first constructed correlating NIRR with leaf structural characteristics for six species, and then validated using ail 48 species. Among the structural characteristic tested in the reflectance model were leaf trichome density, the presence or absence of both leaf bicoloration and a thick leaf cuticle (> 1 mum). leaf thickness. the ratio of palisade mesophyll to spongy mesophyll thickness (PM/SM). the proportion of the mesophyll occupied by intercellular air spaces (%IAS). and the ratio of mesophyll cell surface area exposed to IAS (A(mes)) per unit leaf surface area (A). or A(mes)/A. Multiple regression analysis showed that measured NIRR was highly correlated with A(mes)/A, leaf bicoloration. and the presence of a thick leaf cuticle (r(2) = 0.93). In contrast. correlations between NIRR and leaf trichome density. leaf thickness, the PM/SM ratio, or %IAS were relatively weak (r(2) < 0.25). A model incorporating A(mes)/A, leaf bicoloration. and cuticle thickness predicted NIRR accurately for 48 species (r(2) = 0.43: P < 0.01) and may be useful for linking remotely sensed data to plant structure and function.
引用
收藏
页码:278 / 284
页数:7
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