Grains, growth, and grooving

被引：111

作者：

Rost, MJ ^{[1
]}

Quist, DA ^{[1
]}

Frenken, JWM ^{[1
]}

机构：

[1] Leiden Univ, Kamerlingh Onnes Lab, NL-2300 RA Leiden, Netherlands

来源：

PHYSICAL REVIEW LETTERS | 2003年 / 91卷 / 02期

关键词：

D O I：

10.1103/PhysRevLett.91.026101

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We report the in situ investigation of grain growth and grain boundary migration, performed with a variable-temperature scanning tunneling microscope (STM) on a polycrystalline gold film. Atomic step resolution allowed us to identify the individual grains and, thus, also the grain boundaries. Our special, thermal-drift-compensated STM design made it possible to follow the same sample area over large temperature intervals. In this way, we have directly observed grain boundary migration and grain growth. In a first quantitative analysis we correlate the observed, unexpected changes in surface roughness with the evolution of the grain and grain boundary configuration.

引用

页数：4

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