Characterization of X-ray imaging properties of PbI2 films

被引：31

作者：

Shah, KS ^{[1
]}

Bennett, P ^{[1
]}

Cirignano, L ^{[1
]}

Dmitriyev, Y ^{[1
]}

Klugerman, M ^{[1
]}

Mandal, K ^{[1
]}

Moy, LP ^{[1
]}

机构：

[1] Radiat Monitoring Devices Inc, Watertown, MA 02172 USA

来源：

SEMICONDUCTORS FOR ROOM-TEMPERATURE RADIATION DETECTOR APPLICATIONS II | 1997年 / 487卷

关键词：

D O I：

10.1557/PROC-487-351

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper describes our recent research in developing vacuum sublimed lead iodide films for X-ray imaging. Lead iodide films are promising for this application due to their low dark current, high stopping efficiency, reasonably good charge transport, low cost, and relatively easy scale-up. Lead iodide films (up to 5 x 5 cm(2) area) have been grown and characterized by measuring their X-ray imaging properties such as spatial resolution, and contrast transfer function. Excellent spatial resolution (> 10 lp/mm with high CTF approximate to 50%) has been recorded with PbI2 films. Relevant detection properties such as signal amplitude for given X-ray energy has also been measured and was found to be about 10 times larger as compared to standard phosphor screens used for X-ray imaging. Charge transport and timing characteristics of these films have been measured and the results indicate that these films should be capable of real-time operation. Application of these films for X-ray imaging such as mammography, fluoroscopy, and X-ray diffraction is addressed.

引用

页码：351 / 360

页数：10