Advanced fundamental parameters model for improved profile analysis

被引:54
作者
Bergmann, J
Kleeberg, R
Haase, A
Breidenstein, B
机构
[1] Univ Min & Technol Freiberg, Inst Mineral, DE-09595 Freiberg, Germany
[2] Rich Seifert & Co Rontgewerk, DE-22926 Ahrensburg, Germany
来源
ECRS 5: PROCEEDINGS OF THE FIFTH EUROPEAN CONFERENCE ON RESIDUAL STRESSES | 2000年 / 347-3卷
关键词
microstrain; rietveld; size analysis; standard free; strain analysis; XRD;
D O I
10.4028/www.scientific.net/MSF.347-349.303
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Calculation of the geometric part G of the profile shape is part of the recently developed fundamental parameters profile model. A Monte Carlo raytracing algorithm is used to describe realistic conditions such as multiple slits/collimators, dimension of secondary monochromator and complicated specimen shape. To model the X-ray source more exactly, we successfully introduced a correction for Xray tube tails. A relevant part (6%...30%) of the X-rays is produced not from a proper rectangular line focus shape but from supplementary tails on both sides of the optical focus. Thereby, the measured profile shapes differ from those simply derived from a box-shaped focus. Applying an X-ray tube tails correction allows the use of fundamental parameter description for line profile (micro strain) analysis.
引用
收藏
页码:303 / 308
页数:6
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