IMPROVING SUBWAVELENGTH RESOLUTION OF MULTILAYERED STRUCTURES CONTAINING NEGATIVE-PERMITTIVITY LAYERS BY FLATTING THE TRANSMISSION CURVES

被引:22
作者
Jin, Y. [1 ]
机构
[1] Zhejiang Univ, State Key Lab Modern Opt Instrumentat, Ctr Opt & Electromagnet Res, Hangzhou 310058, Zhejiang, Peoples R China
来源
PROGRESS IN ELECTROMAGNETICS RESEARCH-PIER | 2010年 / 105卷
基金
中国国家自然科学基金;
关键词
NEAR-FIELD; PERFECT LENS; ZERO-INDEX; REFRACTION; METAL; METAMATERIAL; SUPERLENS;
D O I
10.2528/PIER10051309
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Multilayered structures consisting of alternating negative-permittivity and dielectric layers are explored to obtain high-resolution imaging of subwavelength objects. The peaks with the smallest |k(y)| (k(y) is the transverse wave vector) on the transmission curves, which come from the guided modes of the multilayered structures, can not be completely damped by material loss. This makes the amplitudes of the evanescent waves around these peaks inappropriate after transmitted through the imaging structures, and the imaging quality is not good. To solve such a problem, the permittivity of the dielectric layers is appropriately chosen to make these sharp peaks merge with their neighboring peaks, whose corresponding guiding modes in the multilayered structure are cutoff. Wide flat upheavals are then generated on the transmission curves so that evanescent waves in a large range are transmitted through the structures with appropriate amplitudes. In addition, it is found that the sharp peaks with the smallest |k(y)| can be eliminated by adding appropriate coating layers and wide flat upheavals can also be obtained.
引用
收藏
页码:347 / 364
页数:18
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