A unified MOSFET channel charge model for device modeling in circuit simulation

被引:18
作者
Cheng, YH
Chen, K
Imai, K
Hu, CM
机构
[1] Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA
[2] NEC Corp Ltd, ULSI Device Dev Labs, Sagamihara, Kanagawa 229, Japan
关键词
circuit simulation; device modeling; MOSFET model;
D O I
10.1109/43.712096
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
In this paper, we present a simple and accurate MOSFET channel charge model for device modeling in circuit simulation. The model can guarantee good continuities and smooth transitions of charge, capacitance, current, and transconductance from subthreshold to strong inversion with a unified analytical expression, and agrees with the experimental data well at various process and bias conditions from subthreshold and strong inversion, including the moderate inversion region of growing importance for low-voltage/power circuits.
引用
收藏
页码:641 / 644
页数:4
相关论文
共 10 条
[1]   CHARGE-SHEET MODEL OF MOSFET [J].
BREWS, JR .
SOLID-STATE ELECTRONICS, 1978, 21 (02) :345-355
[2]  
CHENG Y, 1997, BSIM3 VERSION 3 USER
[3]  
CHENG Y, 1995, 1995 INT SEM DEV RES
[4]   A physical and scalable I-V model in BSIM3v3 for analog/digital circuit simulation [J].
Cheng, YH ;
Jeng, MC ;
Liu, ZH ;
Huang, JH ;
Chan, MS ;
Chen, K ;
Ko, PK ;
Hu, CM .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1997, 44 (02) :277-287
[5]  
JENG MC, 1990, M9090 ERL U CAL
[6]   THRESHOLD VOLTAGE MODEL FOR DEEP-SUBMICROMETER MOSFETS [J].
LIU, ZH ;
HU, CM ;
HUANG, JH ;
CHAN, TY ;
JENG, MC ;
KO, PK ;
CHENG, YC .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1993, 40 (01) :86-95
[7]  
MIURAMATTAUSCH M, 1994, IEEE T COMPUT AID D, V13, P564
[8]   BSIM - BERKELEY SHORT-CHANNEL IGFET MODEL FOR MOS-TRANSISTORS [J].
SHEU, BJ ;
SCHARFETTER, DL ;
KO, PK ;
JENG, MC .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1987, 22 (04) :558-566
[9]  
SZE SM, 1981, PHYSICS SEMICONDUCTO
[10]  
Tsividis Y., 2011, OPERATION MODELING M