Viscoelastic warpage analysis of surface mount package

被引:22
作者
Miyake, K [1 ]
Yoshida, T
Baik, HG
Park, SW
机构
[1] Nitto Denko Corp, Reliabil Evaluat Ctr, Kameyama, Mie 5190193, Japan
[2] Hyundai Elect Inc, Package Dev Dept, Ichon Si 467701, Kyoungki Do, South Korea
关键词
D O I
10.1115/1.1339820
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The reduction of the warpage of LSI package is a critical issue to ensure good solder joint connection in surface mount. In this study, different combinations of finite element and calculating methods were used to investigate the best method for predicting the thin small outline packages (TSOP) warpage. The results indicate that viscoelastic-GK calculation with relaxation of shear modulus and of bulk modulus using the multilayer shell element is the mast appropriate method for predicting the warpage. All calculations confirm that a compound thickness ratio of 1.2 results in minimal warpage for a large chip TSOP. In this case, the warpage is reduced to near zero and the compound properties have little influence on warpage. However, for a small chip TSOP, a compound thickness ratio of 2.0-2.9 reduces the warpage. The warpage of small chip TSOP shows a severe saddle shape. The ratio and the magnitude of warpage depend on the compound properties. Also, the elastic method may result in a false simulation.
引用
收藏
页码:101 / 104
页数:4
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