Thermal Conductivity of Anodic Alumina Film at (220 to 480) K by Laser Flash Technique

被引：25

作者：

Cai, An ^{[1
,2
]}

Yang, Li-ping ^{[1
]}

Chen, Jiang-ping ^{[2
]}

Xi, Tong-geng ^{[1
]}

Xin, Shi-gang ^{[1
]}

Wu, Wei ^{[1
]}

机构：

[1] Chinese Acad Sci, Shanghai Inst Ceram, Shanghai 200050, Peoples R China

[2] Shanghai Jiao Tong Univ, Shanghai 200240, Peoples R China

来源：

JOURNAL OF CHEMICAL AND ENGINEERING DATA | 2010年 / 55卷 / 11期

基金：

中国国家自然科学基金;

关键词：

DIFFUSIVITY; ARRAYS;

D O I：

10.1021/je100437j

中图分类号：

O414.1 [热力学];

学科分类号：

070201 [理论物理];

摘要：

The thermal conductivity at (220 to 480) K of anodic alumina film of (1.4 to 5) mu m thick and about 30 % porosity, which is grown from aluminum foil, is reported. A laser flash technique was employed to carry out measurements of thermal diffusivity of layered anodic aluminum specimen, while the effective thermal conductivity of anodic alumina film was determined using a two-layered model, which is 1.22 W.m(-1).K(-1) at 220 K and 1.71 W.m(-1).K(-1) at 480 K. Agreement in the overlapping temperature range (220 to 300) K with the measurements of Chen is found. The results showed that the thermal conductivity of anodic alumina films has a temperature dependence of amorphous solids, and the apparent thickness dependence of thermal conductivity is not found for anodic alumina films.

引用

页码：4840 / 4843

页数：4

共 16 条

[1]

MEASUREMENT AND EVALUATION OF THE THERMAL-DIFFUSIVITY OF 2-LAYERED MATERIALS [J].