The materials science synchrotron beamline EDDI for energy-dispersive diffraction analysis

被引:170
作者
Genzel, Ch. [1 ]
Denks, I. A. [1 ]
Gibmeler, J. [1 ]
Klaus, M. [1 ]
Wagener, G. [1 ]
机构
[1] Hahn Meitner Inst Berlin GmbH, Dept Struct Res, D-12489 Berlin, Germany
关键词
X-ray diffraction; energy-dispersive mode; residual stress analysis;
D O I
10.1016/j.nima.2007.05.209
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
In April 2005 the materials science beamline EDDI (Energy Dispersive DIffraction) at the Berlin synchrotron storage ring BESSY started operation. The beamline is operated in the energy-dispersive mode of diffraction using the high energy white photon beam provided by a superconducting 7 T multipole wiggler. Starting from basic information on the beamline set-up, its measuring facilities and data processing concept, the wide range of applications for energy-dispersive diffraction is demonstrated by a series of examples coming from different fields in materials sciences. It will be shown, that the EDDI beamline is especially suitable for the investigation of structural properties and gradients in the near surface region of polycrystalline materials. In particular, this concerns the analysis of multiaxial residual stress fields in the highly stressed surface zone of technical parts. The high photon flux further facilitates fast in situ experiments at room as well as high temperature to monitor for example the growth kinetics and reaction in thin film growth. (c) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码:23 / 33
页数:11
相关论文
共 26 条
[1]  
Berger D., 2002, 8th European Particle Accelerator Conference, P2595
[2]  
Birkholz M, 2006, THIN FILM ANALYSIS BY X-RAY SCATTERING, P1
[3]   X-RAY ENERGY-DISPERSIVE DIFFRACTOMETRY USING SYNCHROTRON RADIATION [J].
BURAS, B ;
OLSEN, JS ;
GERWARD, L ;
WILL, G ;
HINZE, E .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1977, 10 (DEC) :431-438
[4]   Enhancement of energy dispersive residual stress analysis by consideration of detector electronic effects [J].
Denks, I. A. ;
Genzel, Ch. .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2007, 262 (01) :87-94
[5]  
DENKS IA, 2006, MATER SCI FORUM, P524
[6]   The new HMI beamline MAGS: an instrument for hard X-ray diffraction at BESSY [J].
Dudzik, Esther ;
Feyerherm, Ralf ;
Diete, Wolfgang ;
Signorato, Riccardo ;
Zilkens, Christopher .
JOURNAL OF SYNCHROTRON RADIATION, 2006, 13 :421-425
[7]   A MULTIWAVELENGTH METHOD FOR X-RAY-ANALYSIS OF NEAR-SURFACE RESIDUAL-STRESS STATES IN CERAMICS [J].
EIGENMANN, B ;
SCHOLTES, B ;
MACHERAUCH, E .
MATERIALWISSENSCHAFT UND WERKSTOFFTECHNIK, 1990, 21 (07) :257-265
[8]  
EIPER E, 2006, BESSY ANN REPORT
[9]   In situ investigation by energy dispersive X-ray diffraction (EDXRD) of the growth of magnetron sputtered ITO films [J].
Ellmer, K ;
Mientus, R ;
Rossner, H .
SURFACE & COATINGS TECHNOLOGY, 2001, 142 (142-144) :1094-1099
[10]   A self-consistent method for X-ray diffraction analysis of multiaxial residual-stress fields in the near-surface region of polycrystalline materials. I. Theoretical concept [J].
Genzel, C .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1999, 32 :770-778