First results from a second generation toroidal electron spectrometer

被引：55

作者：

Broekman, L ^{[1
]}

Tadich, A ^{[1
]}

Huwald, E ^{[1
]}

Riley, J ^{[1
]}

Leckey, R ^{[1
]}

Seyller, T ^{[1
]}

Emtsev, K ^{[1
]}

Ley, L ^{[1
]}

机构：

[1] Univ Erlangen Nurnberg, Inst Tech Phys 2, D-91058 Erlangen, Germany

来源：

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 2005年 / 144卷

关键词：

angle resolved photoelectron spectroscopy; ARUPS; band structure; x-ray photoelectron diffraction; SiC (0001); Cu (111); graphite; Kikutchi; Bragg;

D O I：

10.1016/j.elspec.2005.01.022

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

A second generation toroidal electron spectrometer is briefly described and results presented that demonstrate its capabilities. Band structure measurements obtained from graphitised SiC (0 0 0 1) and X-ray photoelectron diffraction results from Cu (1 1 1) and graphite are presented. (c) 2005 Elsevier B.V. All rights reserved.

引用

页码：1001 / 1004

页数：4

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