Support vector machines for classifying and describing credit applicants: detecting typical and critical regions

Credit applicants are assigned to good or bad risk classes according to their record of defaulting. Each applicant is described by a high-dimensional input vector of situational characteristics and by an associated class label. A statistical model, which maps the inputs to the labels, can decide whether a new credit applicant should be accepted or rejected, by predicting the class label given the new inputs. Support vector machines ( SVM) from statistical learning theory can build such models from the data, requiring extremely weak prior assumptions about the model structure. Furthermore, SVM divide a set of labelled credit applicants into subsets of 'typical' and 'critical' patterns. The correct class label of a typical pattern is usually very easy to predict, even with linear classification methods. Such patterns do not contain much information about the classification boundary. The critical patterns ( the support vectors) contain the less trivial training examples. For instance, linear discriminant analysis with prior training subset selection via SVM also leads to improved generalization. Using non-linear SVM, more 'surprising' critical regions may be detected, but owing to the relative sparseness of the data, this potential seems to be limited in credit scoring practice.