Deposition and characterization of metal sulfide dielectric coatings for hollow glass waveguides

被引:23
作者
Gopal, V [1 ]
Harrington, JA [1 ]
机构
[1] Rutgers State Univ, Dept Ceram & Mat Engn, Piscataway, NJ 08854 USA
来源
OPTICS EXPRESS | 2003年 / 11卷 / 24期
关键词
D O I
10.1364/OE.11.003182
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Metal sulfide dielectric thin films have been deposited using dynamic wet chemistry processing on silver coated hollow glass waveguides (HGWs). The sulfides used were cadmium sulfide (CdS) and lead sulfide (PbS); both films have excellent infrared transparency and high refractive index contrast. The thickness of these thin films can be tailored to minimize the attenuation of the HGW over specific infrared wavelengths. We have made both single and multiple dielectric (2 and 3 layer) metal coated HGWs using CdS and PbS deposited over an inner Ag layer. The straight lowest loss measured at 1.55 mum for a 1,000-mum bore Ag/CdS/PbS/CdS HGW was 0.06 dB/m. This loss is three times less than that measured for a single layer Ag/CdS coated HGW at 1.55 mum. (C) 2003 Optical Society of America.
引用
收藏
页码:3182 / 3187
页数:6
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