Absorption loss at nanorough silver back reflector of thin-film silicon solar cells

被引:195
作者
Springer, J
Poruba, A
Müllerova, L
Vanecek, M
Kluth, O
Rech, B
机构
[1] Acad Sci Czech Republ, Inst Phys, CZ-16253 Prague 6, Czech Republic
[2] Forschungszentrum Julich, Inst Photovolta, D-52425 Julich, Germany
关键词
D O I
10.1063/1.1633652
中图分类号
O59 [应用物理学];
学科分类号
摘要
Absorption losses at a nanorough silver back reflector of a solar cell were measured with high accuracy by photothermal deflection spectroscopy. Roughness was characterized by atomic force microscopy. The observed increase of absorption, compared to the smooth silver, was explained by the surface plasmon absorption. Two series of silver back reflectors (one covered with thin ZnO layer) were investigated and their absorption related to surface morphology. (C) 2004 American Institute of Physics.
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页码:1427 / 1429
页数:3
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