Efficient algorithms to assess component and gate importance in fault tree analysis

被引:62
作者
Dutuit, Y [1 ]
Rauzy, A
机构
[1] Univ Bordeaux 1, LAP, F-33405 Talence, France
[2] CNRS, LABRI, F-33405 Talence, France
关键词
fault trees; importance factors; binary decision diagrams;
D O I
10.1016/S0951-8320(01)00004-7
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
One of the principal activities of risk assessment is either the ranking or the categorization of structures, systems and components with respect to their risk-significance or their safety-significance. Several measures, so-called importance factors, of such a significance have been proposed for the case where the support model is a fault tree. In this article, we show how binary decision diagrams can be use to assess efficiently a number of classical importance factors. This work completes the preliminary results obtained recently by Andrews and Sinnamon, and the authors. II deals also with the concept of joint reliability importance. (C) 2001 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:213 / 222
页数:10
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