Application of the multiplicative regularized contrast source inversion method on TM- and TE-polarized experimental Fresnel data

This paper presents the results of profile inversion of multi-frequency electromagnetic scattered field data, measured by the Institute Fresnel (Marseille, France), from cylindrical objects, both for TM and TE illuminations. The reconstructions are obtained by applying the multiplicative regularized contrast source inversion (MR-CSI) method. Since we are dealing with configurations consisting of both dielectric and metallic objects, we reconstruct both the permittivity and the conductivity of the unknown objects. The results show that the MR-CSI method successfully performs 'blind' inversion of a wide class of scattered field data.