Patent statistics: deciphering a 'real' versus a 'pseudo' proxy of innovation

被引:94
作者
Watanabe, C [1 ]
Tsuji, YS [1 ]
Griffy-Brown, C [1 ]
机构
[1] Tokyo Inst Technol, Dept Ind Engn & Management, Meguro Ku, Tokyo 1528552, Japan
关键词
patent statistics; US foreign priority patents; pseudo proxy of innovation; patentometrics;
D O I
10.1016/S0166-4972(01)00025-6
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Patent statistics have fascinated economists concerned about innovation for a long time. However, fundamental questions remain as to whether or not patent statistics represent the real state of innovation. As Griliches pointed out, substantial questions involve: What aspects of economic activities do patent statistics actually capture? And, what would we like them to measure? He pointed out that these statistics can be a mirage appearing to provide a great number of objective and reliable proxies for innovation. This paper aims to address some of these questions by making a comparative evaluation of the representability of patent statistics in four levels of the innovation process, using as examples research and development (R&D) in Japan's printer and photovoltaic solar cell (PV) industries over the last two decades. Furthermore, this research provides a new set of patent statistics which could be considered a more reliable proxy for innovation. (C) 2001 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:783 / 790
页数:8
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