Comment on "Structural analysis of the SiO2/Si(100) interface by means of photoelectron diffraction" -: Reply -: art. no. 189602

被引：5

作者：

Dreiner, S ^{[1
]}

Schürmann, M ^{[1
]}

Westphal, C ^{[1
]}

机构：

[1] Univ Dortmund, Lehrstuhl Expt Phys 1, D-44221 Dortmund, Germany

来源：

PHYSICAL REVIEW LETTERS | 2005年 / 94卷 / 18期

关键词：

D O I：

10.1103/PhysRevLett.94.189602

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页数：1

共 11 条

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