In-situ electrical addressing of one-dimensional gold nanoparticle assemblies

被引：7

作者：

Blech, Kerstin ^{[1
]}

Noyong, Michael ^{[1
]}

Juillerat, Frederic

Nakayama, Tomonobu

Hofmann, Heinrich ^{[2
]}

Simon, Ulrich ^{[1
]}

机构：

[1] Rhein Westfal TH Aachen, Inst Inorgan Chem, D-52074 Aachen, Germany

[2] Ecole Polytech Fed Lausanne, LTP, CH-1015 Lausanne, Switzerland

来源：

JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY | 2008年 / 8卷 / 01期

关键词：

gold nanoparticles; 1D assembly; EUV-IL; electrical characterization; conductivity;

D O I：

10.1166/jnn.2008.192

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Substrates with 1-dimensional nanosize grooves were prepared using extreme-ultraviolet interference lithography (EUV-IL), wherein gold nanoparticles were self-assembled to form 1-dimensional structures. To measure the electrical properties of gold nanoparticle chains we introduce a novel in-situ measuring method based on nanomanipulator system in a scanning electron microscope. This method comprises enormous versatility for the precisely electrical addressing of low-dimensional nanoscale structures and may even be applied to routinely addressing of structures in the sub-10 nm range.

引用

页码：461 / 465

页数：5

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