Structural characterization of thin film photonic crystals

被引：20

作者：

Subramania, G ^{[1
]}

Biswas, R

Constant, K

Sigalas, MM

Ho, KM

机构：

[1] Iowa State Univ, Ames Lab, Dept Phys & Astron, Ames, IA 50011 USA

[2] Iowa State Univ, Ctr Microelect Res, Ames, IA 50011 USA

[3] Iowa State Univ, Dept Mat Sci & Engn, Ames, IA 50011 USA

来源：

PHYSICAL REVIEW B | 2001年 / 63卷 / 23期

关键词：

D O I：

10.1103/PhysRevB.63.235111

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We quantitatively analyze the structure of thin film inverse-opal photonic crystals composed of ordered arrays of air pores in a background of titania. Ordering of the sphere template and introduction of the titania background were performed simultaneously in the thin film photonic crystals. Nondestructive optical measurements of backfilling with high refractive index liquids, angle-resolved reflectivity, and optical spectroscopy were combined with band-structure calculations. The analysis reveals a thin film photonic crystal structure with a very high filling fraction (92-94%) of air and a substantial compression along the c axis (similar to 22-25%).

引用

页数：7

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