Structures and local electrical properties of ferroelectric polymer thin films in thermal process investigated by dynamic-mode atomic force microscopy

被引：10

作者：

Fukuma, T ^{[1
]}

Kobayashi, K ^{[1
]}

Horiuchi, T ^{[1
]}

Yamada, H ^{[1
]}

Matsushige, K ^{[1
]}

机构：

[1] Kyoto Univ, Dept Elect Sci & Engn, Kyoto 6068501, Japan

来源：

THIN SOLID FILMS | 2001年 / 397卷 / 1-2期

关键词：

atomic force microscopy (AFM); ferroelectric properties polymers; surface structures;

D O I：

10.1016/S0040-6090(01)01399-2

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Local changes in structure and surface potential of ferroelectric copolymer thin films in thermal processes were directly investigated by dynamic-mode atomic force microscopy. The copolymer thin films formed on graphite substrates consist of rodlike grains when they are annealed at a temperature between the Curie point and the melting point. Atomic force microscopy (AFM) observations revealed that the fine structures in the rod-like grains suddenly disappeared and that the grains turned smooth at approximately 120 degreesC during the heating process. They in turn gradually reappeared from 85 to 70 degreesC during the cooling process. These two transition temperatures approximately corresponded to the Curie points of bulk copolymer. We also measured the local surface potential variation in the heating process by Kelvin force microscopy. These results show the ferroelectric phase transition is accompanied by the changes of both the internal structure and the surface potential of the grains. (C) 2001 Elsevier Science B.V. All rights reserved.

引用

页码：133 / 137

页数：5

共 20 条

[1] Structures and local polarized domains of ferroelectric organic films studied by atomic force microscopy [J].