Band-to-band illumination in noise semiconductor spectroscopy

被引:10
作者
Dyakonova, NV
Levinshtein, ME
Rumyantsev, SL
机构
[1] Ioffe Physico-Technical Institute, St Petersburg 194021
关键词
D O I
10.1088/0268-1242/11/2/005
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The effect of band-to-band illumination on noise spectra has been investigated in n-GaAs with an equilibrium concentration n(0) = 10(17) cm(-3). The theoretical predictions of Levinshtien et al have been compared in detail with experimental results. A new local level has been observed and investigated using the technique of level recharging by minority carriers. The capture cross section of this level depends exponentially on temperature: sigma = sigma(0) exp(-E(1)/kT). The level parameters: activation energy E(1), level energy E(0), capture cross section sigma and trap concentration N-1 have been determined. Using band-to-band illumination techniques the parameters of a trap investigated recently by Copland have been redetermined. It has been shown that band-to-band illumination is a very effective tool in noise spectroscopy.
引用
收藏
页码:177 / 180
页数:4
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