Interpretation of STM images: The MoS2 surface

被引:45
作者
Altibelli, A
Joachim, C
Sautet, P
机构
[1] CEMES,LOE,CNRS,F-31055 TOULOUSE,FRANCE
[2] IRC,CNRS,F-69626 VILLEURBANNE,FRANCE
关键词
semiconducting surfaces; semi-empirical models and model calculations; single crystal surfaces; tunnelling;
D O I
10.1016/S0039-6028(96)00864-3
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
From the elastic scattering quantum chemistry technique, it is shown that the images of the MoS2 surface obtained with an STM depend on the distance between the tip apex and the surface. At large distances, the tip apex and the Mo d-bands are coupled only through the sulphur surface layer. This leads to image the sulphur sites only. At small distances (<4 Angstrom), there is a superposition between this through bond tunnelling and the direct tip apex-Mo d-bands tunnelling. This superposition is destructive and the contrast is inverted; however, the two images remain very similar, which may lead to a difficult experimental interpretation of the STM images when the tip apex-to-surface distance is not well controlled.
引用
收藏
页码:209 / 220
页数:12
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