Detection of age and insect damage incurred by wheat, with an electronic nose

被引：74

作者：

Zhang, Hongmei ^{[1
]}

Wang, Jun ^{[1
]}

机构：

[1] Zhejiang Univ, Dept Agr Engn, Hangzhou 310029, Peoples R China

来源：

JOURNAL OF STORED PRODUCTS RESEARCH | 2007年 / 43卷 / 04期

关键词：

E-nose; principal-component analysis (PCA); linear-discriminant analysis (LDA); wheat;

D O I：

10.1016/j.jspr.2007.01.004

中图分类号：

Q96 [昆虫学];

学科分类号：

摘要：

Wheats of five storage ages and with 15 degrees of insect damage were evaluated and classified by the static-headspace sampling method using an electronic nose (E-nose). A commercial E-nose (PEN2) comprising 10 metal-oxide semiconductor (MOS) sensors was used to generate a typical chemical fingerprint of the volatile compounds present in the samples. Principal-component analysis (PCA) and linear-discriminant analysis (LDA) were applied to the generated patterns to achieve classification into the five groups of different storage-age wheats and the 15 groups of different degrees of insect-damaged wheat. The results obtained indicated that the E-nose could discriminate successfully among wheats of different age and with different degrees of insect damage. (c) 2007 Elsevier Ltd. All rights reserved.

引用

页码：489 / 495

页数：7

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