Amorphous water-ice relaxations measured with soft-landed ions

被引：64

作者：

Tsekouras, AA ^{[1
]}

Iedema, MJ ^{[1
]}

Cowin, JP ^{[1
]}

机构：

[1] Pacific NW Lab, Environm Mol Sci Lab, Richland, WA 99352 USA

来源：

PHYSICAL REVIEW LETTERS | 1998年 / 80卷 / 26期

关键词：

D O I：

10.1103/PhysRevLett.80.5798

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

D3O+ and Cs+ ions (less than or equal to 1 eV) were soft landed on vacuum-deposited amorphous water ice at 30 K. The samples charged capacitively with an initial dielectric constant of 2. Then the voltage was measured via a Kelvin probe while the sample temperature was ramped. A sharp drop in voltage occurred near 50 K, due to dielectric responses occurring at much less than the expected 135 K. This was due to relaxations of the highly strained amorphous ice. Preannealing the ice could move the electrical relaxation up to as high as 120 K. Ion migration through the ice was not observed below 190 K. [s0031-9007(98)06347-9].

引用

页码：5798 / 5801

页数：4

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