Determination of the position of V4+ as minor component in XPS spectra by difference spectra

被引：36

作者：

Chen, YS ^{[1
]}

Xie, K ^{[1
]}

Liu, ZX ^{[1
]}

机构：

[1] Chinese Acad Sci, Inst Phys, State Key Lab Surface Phys, Beijing 100080, Peoples R China

来源：

APPLIED SURFACE SCIENCE | 1998年 / 133卷 / 03期

关键词：

X-ray photoelectron spectroscopy (XPS); vanadium oxide;

D O I：

10.1016/S0169-4332(98)00202-5

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Difference spectra are used to determine the positions of minor components in XPS spectra without additional samples and without concerning the complication of the background. The requirements for obtaining accurate difference spectra are discussed. The displacement between V4+ 2P(3/2), a minor component in V2O5 XPS spectra, and V5+ 2p(3/2), is determined to be 2.0 eV. (C) 1998 Elsevier Science B.V. All rights reserved.

引用

页码：221 / 224

页数：4

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