Direct measurement of electron density in microdischarge at atmospheric pressure by Stark broadening

被引：109

作者：

Dong, LF ^{[1
]}

Ran, JX ^{[1
]}

Mao, ZG ^{[1
]}

机构：

[1] Hebei Univ, Coll Phys Sci & Technol, Baoding 071002, Peoples R China

来源：

APPLIED PHYSICS LETTERS | 2005年 / 86卷 / 16期

基金：

中国国家自然科学基金;

关键词：

D O I：

10.1063/1.1906299

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We present a method and results for measurement of electron density in atmospheric-pressure dielectric barrier discharge. The electron density of microdischarge in atmospheric pressure argon is measured by using the spectral line profile method. The asymmetrical deconvolution is used to obtain Stark broadening. The results show that the electron density in single filamentary microdischarge at atmospheric pressure argon is 3.05 X 10(15) cm(-3) if the electron temperature is 10 000 K. The result is in good agreement with the simulation. The electron density in dielectric barrier discharge increases with the increase of applied voltaore. (c) 2005 American Institute of Physics.

引用

页码：1 / 3

页数：3

共 17 条

[1]

Chabrier G, 2002, PHYS REV E, VE 65, P1

[2] Generation of high-power-density atmospheric pressure plasma with liquid electrodes [J].

Dong, LF ;

Mao, ZG ;

Yin, ZQ ;

Ran, JX .

APPLIED PHYSICS LETTERS, 2004, 84 (25) :5142-5144

[3] Spatio-temporal dynamics of discharge domains in a dielectric barrier discharge device [J].

Dong, LF ;

Yin, ZQ ;

Li, XC ;

Wang, L .

PLASMA SOURCES SCIENCE & TECHNOLOGY, 2003, 12 (03) :380-388

[4] MODELING AND APPLICATIONS OF SILENT DISCHARGE PLASMAS [J].

ELIASSON, B ;

KOGELSCHATZ, U .

IEEE TRANSACTIONS ON PLASMA SCIENCE, 1991, 19 (02) :309-323

[5]

GRIEM HR, 1964, PLASMA SPECTROSCOPY, P492

[6]

HAMANO K, 2003, 34 ANN LUN PLAN SCI

[7] Filamentary, patterned, and diffuse barrier discharges [J].

Kogelschatz, U .

IEEE TRANSACTIONS ON PLASMA SCIENCE, 2002, 30 (04) :1400-1408

[8] On the use of non-hydrogenic spectral line profiles for plasma electron density diagnostics [J].

Konjevic, N .

PLASMA SOURCES SCIENCE & TECHNOLOGY, 2001, 10 (02) :356-363

[9] VANDERWAALS BROADENING OF ARGON ABSORPTION-LINES [J].

LEE, CS ;

CAMM, DM ;

COPLEY, GH .

JOURNAL OF QUANTITATIVE SPECTROSCOPY & RADIATIVE TRANSFER, 1975, 15 (03) :211-216

[10] The HeI 706.52 nm line shape characteristics in the plasma diagnostics [J].

Milosavljevic, V ;

Djenize, S .

EUROPEAN PHYSICAL JOURNAL D, 2003, 23 (03) :385-390

← 1 2 →