Measurement of the van der Waals force in an atomic mirror

被引:229
作者
Landragin, A
Courtois, JY
Labeyrie, G
Vansteenkiste, N
Westbrook, CI
Aspect, A
机构
[1] Institut d’optique Théorique et Appliquée, URA 14 du CNRS, Université Paris Sud, Orsay Cedex, F-91403
关键词
D O I
10.1103/PhysRevLett.77.1464
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We have measured the attractive van der Waals force between a dielectric wall and an atom in its ground state. The method is a direct force measurement in which we use an evanescent wave atomic mirror to balance the van der Waals force and the inertia of the incident atom.
引用
收藏
页码:1464 / 1467
页数:4
相关论文
共 25 条
[1]   ATOM OPTICS [J].
ADAMS, CS ;
SIGEL, M ;
MLYNEK, J .
PHYSICS REPORTS-REVIEW SECTION OF PHYSICS LETTERS, 1994, 240 (03) :143-210
[2]   NONDESTRUCTIVE DETECTION OF ATOMS BOUNCING ON AN EVANESCENT-WAVE [J].
ASPECT, A ;
KAISER, R ;
VANSTEENKISTE, N ;
VIGNOLO, P ;
WESTBROOK, CI .
PHYSICAL REVIEW A, 1995, 52 (06) :4704-4708
[3]  
ASPECT A, 1996, COHERENT COLLECTIVE
[4]  
Born M., 1959, Principles of Optics
[5]   THE INFLUENCE OF RETARDATION ON THE LONDON-VANDERWAALS FORCES [J].
CASIMIR, HBG ;
POLDER, D .
PHYSICAL REVIEW, 1948, 73 (04) :360-372
[6]  
COOK RJ, 1982, OPT COMMUN, V43, P258, DOI 10.1016/0030-4018(82)90392-3
[7]   Internal dynamics of multilevel atoms near a vacuum-dielectric interface [J].
Courtois, JY ;
Courty, JM ;
Mertz, JC .
PHYSICAL REVIEW A, 1996, 53 (03) :1862-1878
[8]  
DESBIOLLES P, IN PRESS
[9]   VAN-DER-WAALS INTERACTIONS BETWEEN EXCITED-STATE ATOMS AND DISPERSIVE DIELECTRIC SURFACES [J].
FICHET, M ;
SCHULLER, F ;
BLOCH, D ;
DUCLOY, M .
PHYSICAL REVIEW A, 1995, 51 (02) :1553-1564
[10]  
HAROCHE S, 1992, FUNDAMENTAL SYSTEM Q