Determination of the thermal conductivity of diamond-like nanocomposite films using a scanning thermal microscope

被引：75

作者：

Ruiz, F ^{[1
]}

Sun, WD

Pollak, FH

Venkatraman, C

机构：

[1] CUNY Brooklyn Coll, Dept Phys, Brooklyn, NY 11210 USA

[2] CUNY Brooklyn Coll, New York State Ctr Adv Technol Ultrafast Photon M, Brooklyn, NY 11210 USA

[3] Adv Refractory Technol Inc, Buffalo, NY 14207 USA

[4] Univ Autonoma San Luis Potosi, San Luis Potosi 78000, Mexico

[5] CUNY Grad Sch & Univ Ctr, New York, NY 10036 USA

来源：

APPLIED PHYSICS LETTERS | 1998年 / 73卷 / 13期

关键词：

D O I：

10.1063/1.122287

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Amorphous "diamond-like/quartz-like'' composites a-(C:H/Si:O) constitute a novel class of diamond-related materials with a number of unique bulk and surface properties. Using a thermal imaging microscope we have determined the thermal conductivity (kappa(s))of a-C:H/Si:O) films deposited on Si(001) substrates. We have developed a calibration procedure which makes it possible to use this method for the evaluation of not only topographical variations in kappa(s) but also absolute values. (C) 1998 American Institute of Physics. [S0003-6951(98)00339-8].

引用

页码：1802 / 1804

页数：3

共 13 条

[1] POSITRON-ANNIHILATION STUDIES OF DIAMOND-LIKE NANOCOMPOSITE FILMS [J].

ASOKAKUMAR, P ;

DORFMAN, BF ;

ABRAIZOV, MG ;

YAN, D ;

POLLAK, FH .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 1995, 13 (03) :1044-1047

[2]

DORFMAN B, 1994, MATER RES SOC SYMP P, V349, P547, DOI 10.1557/PROC-349-547

[3]

DORFMAN B, 1994, MATER RES SOC SYMP P, V351, P43, DOI 10.1557/PROC-351-43

[4]

DORFMAN B, 1995, NIST SPECIAL PUBLICA, V885, P769

[5] DIAMOND-LIKE NANOCOMPOSITES (DLN) [J].

DORFMAN, VF .

THIN SOLID FILMS, 1992, 212 (1-2) :267-273

[6] DIAMOND-LIKE NANOCOMPOSITES - ELECTRONIC TRANSPORT MECHANISMS AND SOME APPLICATIONS [J].

DORFMAN, VF ;

BOZHKO, A ;

PYPKIN, BN ;

BORRA, RT ;

SRIVATSA, AR ;

ZHANG, H ;

SKOTHEIM, TA ;

KHAN, I ;

RODICHEV, D ;

KIRPILENKO, G .

THIN SOLID FILMS, 1992, 212 (1-2) :274-281

[7]

FELDMAN A, 1995, NIST SPEC PUBL, V885, P769

[8]

GRAEBNER JE, 1995, NIST SPEC PUBL, V885, P557

[9] Sub-surface imaging by scanning thermal microscopy [J].

Hammiche, A ;

Pollock, HM ;

Song, M ;

Hourston, DJ .

MEASUREMENT SCIENCE AND TECHNOLOGY, 1996, 7 (02) :142-150

[10] Localized thermal analysis using a miniaturized resistive probe [J].

Hammiche, A ;

Reading, M ;

Pollock, HM ;

Song, M ;

Hourston, DJ .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1996, 67 (12) :4268-4274

← 1 2 →