Time resolved detection of particle removal from dielectrics on femtosecond laser ablation

被引:46
作者
Rosenfeld, A [1 ]
Ashkenasi, D [1 ]
Varel, H [1 ]
Wahmer, M [1 ]
Campbell, EEB [1 ]
机构
[1] Max Born Inst Nichtlineare Opt & Kurzzeitspektros, D-12474 Berlin, Germany
关键词
time resolved detection; dielectrics; ablation;
D O I
10.1016/S0169-4332(97)00613-2
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The dynamics of the ablation process in different oxides (amorphous and crystalline quartz. sapphire and MgO) after intensive lasts excitation was studied by a combination of the femtosecond pump-probe technique with optical surface scattering. A 120-fs laser pulse (lambda = 800 nm) was focused onto the sample with a fluence at least twice the single-shot surface damage threshold. A much weal;er probe laser pulse optically aligned collinear to the pump beam illuminated the excited area at variable delay times up to 100 ps. We observe a material dependent increase in the scattering signal after a certain delay time which we interpret as the onset of the ablation process. This occurs much earlier for amorphous and crystalline silica than for sapphire or MgO, as a consequence of differences in the electron-phonon coupling strength. The morphology of the irradiated spot on sapphire, amorphous and crystalline quartz is indicative of melting and vaporisation in contrast to that on MgO which clearly shows fracturing. (C) 1998 Elsevier Science B.V.
引用
收藏
页码:76 / 80
页数:5
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