Finite-voltage shot noise in normal-metal-superconductor junctions

被引:21
作者
Fauchere, AL [1 ]
Lesovik, GB
Blatter, G
机构
[1] ETH Zurich, CH-8093 Zurich, Switzerland
[2] Russian Acad Sci, Inst Solid State Phys, Chernogolovka 142432, Moscow District, Russia
[3] Univ Zurich, CH-8093 Zurich, Switzerland
来源
PHYSICAL REVIEW B | 1998年 / 58卷 / 17期
关键词
D O I
10.1103/PhysRevB.58.11177
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We express the low-frequency shot noise in a disordered normal-metal-superconductor (NS) junction at finite (subgap) voltage in terms of the normal scattering amplitudes and the Andreev reflection amplitude. In the multichannel limit, the conductance exhibits resonances which are accompanied by an enhancement of the (differential) shot noise. In the study of multichannel single and double barrier junctions we discuss the noise properties of coherent transport at low versus high voltage with respect to the Andreev level spacing. [S0163-1829(98)08738-4].
引用
收藏
页码:11177 / 11180
页数:4
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