Analysis of the interaction mechanisms in dynamic mode SFM by means of experimental data and computer simulation

The performance of a scanning force microscope (SFM) operated in the dynamic mode at high oscillation amplitudes is determined by the response of the system to a given set of interaction forces between the probing tip and the sample surface. To clarify the details of the cantilever/tip dynamics two different aspects were investigated in experiment and computer simulation. First, the interaction forces dominating the oscillatory motion of the probe were varied by applying an additional electrostatic force field. It is shown that such variations in the attractive part of the interaction potential can cause a switching between two different oscillation states and thereby significantly contribute to the contrast obtained from phase imaging. Secondly, the interaction forces were kept constant but the system response itself was varied by modifying the effective quality factor of the oscillating cantilever with an active feedback circuit. This provides a means to influence the transition from the attractive to the partly repulsive interaction regime, i.e. the onset of the intermittent contact or tapping mode.