High temperature lead-free solder for microelectronics

被引:60
作者
Gayle, FW
Becka, G
Badgett, J
Whitten, G
Pan, TY
Grusd, A
Bauer, B
Lathrop, R
Slattery, J
Anderson, I
Foley, J
Gickler, A
Napp, D
Mather, J
Olson, C
机构
[1] NIST, Div Met, Gaithersburg, MD 20899 USA
[2] AlliedSignal Inc, Sunnyvale, CA USA
[3] Amkor Technol Inc, W Chester, PA 19380 USA
[4] Delphi Delco Elect Syst, Kokomo, IN USA
[5] Ford Motor Co, Dearborn, MI 48121 USA
[6] Iowa State Univ, Ames, IA USA
[7] Natl Ctr Mfg Sci, Ann Arbor, MI 48108 USA
[8] Rockwell Int Corp, Milwaukee, WI 53202 USA
来源
JOM-JOURNAL OF THE MINERALS METALS & MATERIALS SOCIETY | 2001年 / 53卷 / 06期
基金
美国国家科学基金会;
关键词
Ball Grid Array; Weibull Plot; Weibull Analysis; Chip Resistor; Ball Grid Array Package;
D O I
10.1007/s11837-001-0097-5
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This paper reports results of a four-year industrial consortium effort to develop lead-free solders for high-temperature applications (up to 160 degreesC). Work included preliminary evaluations of 32 tin-based alloys, a screening of the thermomechanical fatigue performance of 13 promising alloys, and a full manufacturability and fatigue testing of the seven most promising of those alloys, namely Sn-3.5Ag, Sn-4Ag-1Cu, Sn-4Ag 0.5Cu, Sn-2.5Ag-0.8Cu-0.5Sb, Sn-4.6Ag-1.6Cu-1Sb-1Bi, Sn-3.3Ag-1Cu-3.3Bi, and Sn-3.5Ag-1.5In (compositions in weight percent). Eight different components were used on the reliability test vehicle, and the alloys were compared through Weibull analysis. In addition, the same seven experimental alloys were tested with ball grid army packages cycled up to 100 degreesC or 125 degreesC. All the lead-free alloys performed well, but those containing bismuth showed especially outstanding performance. In general, the ternary and higher alloys performed as well or better than the indus try standard tin-silver eutectic, suggesting that solders other than the tin-silver eutectic should be considered for high-reliability, high-temperature applications.
引用
收藏
页码:17 / 21
页数:5
相关论文
共 2 条
[1]   Experimental and thermodynamic assessment of Sn-Ag-Cu solder alloys [J].
Moon, KW ;
Boettinger, WJ ;
Kattner, UR ;
Biancaniello, FS ;
Handwerker, CA .
JOURNAL OF ELECTRONIC MATERIALS, 2000, 29 (10) :1122-1136
[2]  
*NAT CTR MAN SCI, 2001, NCMS HIGH TEMP FAT R