Spatially resolved assessment of power losses due to bulk material quality and metalization problems

被引：3

作者：

Isenberg, J ^{[1
]}

van der Heide, ASH ^{[1
]}

Warta, W ^{[1
]}

机构：

[1] Fraunhofer Inst Solar Energy Syst, D-79110 Freiburg, Germany

来源：

CONFERENCE RECORD OF THE THIRTY-FIRST IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE - 2005 | 2005年

关键词：

D O I：

10.1109/PVSC.2005.1488278

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

The main advantage of Illuminated Lock-In Thermography (ILIT) over standard (Dark) Lock-in Thermography is the ability to measure at actual operation conditions of solar cells. Thus ILIT allows a quantitative and spatially resolved investigation of the sum of all power losses in a solar cell at actual operation conditions with one measurement. The quantitative influence of low bulk material quality on solar cell performance is investigated. Also the locations of high contact resistance of the front-side metalization and of high series resistance within the metalization were determined with ILIT. The results were compared with Corescan results for the same cells and a good correlation between the locations determined with both methods was found.

引用

页码：907 / 910

页数：4

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