Identification and characterisation of thaumasite by XRPD techniques

被引：27

作者：

Barnett, SJ ^{[1
]}

Adam, CD ^{[1
]}

Jackson, ARW ^{[1
]}

Hywel-Evans, PD ^{[1
]}

机构：

[1] Staffordshire Univ, Sch Sci, Stoke On Trent ST4 2DE, Staffs, England

来源：

CEMENT & CONCRETE COMPOSITES | 1999年 / 21卷 / 02期

关键词：

full pattern fitting; Rietveld refinement; thaumasite; X-ray powder diffraction;

D O I：

10.1016/S0958-9465(98)00019-5

中图分类号：

TU [建筑科学];

学科分类号：

0813 [建筑学];

摘要：

X-ray powder diffraction (XRPD) data analysis techniques (full pattern fitting and Rietveld refinement) have been evaluated as a means of characterisation of thaumasite. For the first time, these XRPD methods, which employ the whole of the powder pattern rather than just a few reflections, have been used to study systems containing thaumasite. Structure refinement by Rietveld methods, using synchrotron data, produced a crystal structure model of thaumasite suitable for use in the analysis of thaumasite in cements. The use of these techniques in the analysis of cement systems containing thaumasite is discussed. An example of the use of Rietveld refinement in quantification of a sample containing thaumasite is given. (C) 1999 Elsevier Science Ltd. All rights reserved.

引用

页码：123 / 128

页数：6

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