Shift and intensity modeling in spectroscopy - general concept and applications

被引:25
作者
Westad, F
Martens, H
机构
[1] Camo ASA, N-0115 Oslo, Norway
[2] Norwegian Univ Sci & Technol, Inst Phys Chem, N-7034 Trondheim, Norway
关键词
shift and intensity modeling; spectroscopy;
D O I
10.1016/S0169-7439(98)00144-0
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Multivariate analysis and calibration in spectroscopy have been widely used in many fields of applications in recent years. The number of components to use in such applications for sufficiently describing the spectra is dependent on the stability of positions of the peaks of interest. Unwanted shifts give rise to a more complex model, i.e., more components. Various kinds of shift correction can be applied as preprocessing tools to cope with these effects. In this paper we describe a general concept of how to model intensity (peak height) and position as separate phenomena. We described methods and theory from image modeling, and apply them on one-dimensional signals such as traditional Raman spectroscopy. (C) 1999 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:361 / 370
页数:10
相关论文
共 7 条
[1]  
BREKKE T, 1989, ANAL CHIM ACTA, V223, P12
[2]   NMR spectral quantitation by principal-component analysis .2. Determination of frequency and phase shifts [J].
Brown, TR ;
Stoyanova, R .
JOURNAL OF MAGNETIC RESONANCE SERIES B, 1996, 112 (01) :32-43
[3]   DETERMINING OPTICAL-FLOW [J].
HORN, BKP ;
SCHUNCK, BG .
ARTIFICIAL INTELLIGENCE, 1981, 17 (1-3) :185-203
[4]   DETERMINING OPTICAL-FLOW - A RETROSPECTIVE [J].
HORN, BKP ;
SCHUNCK, BG .
ARTIFICIAL INTELLIGENCE, 1993, 59 (1-2) :81-87
[5]   AUTOMATIC REDUCTION OF NMR SPECTROSCOPIC DATA FOR STATISTICAL AND PATTERN-RECOGNITION CLASSIFICATION OF SAMPLES [J].
SPRAUL, M ;
NEIDIG, P ;
KLAUCK, U ;
KESSLER, P ;
HOLMES, E ;
NICHOLSON, JK ;
SWEATMAN, BC ;
SALMAN, SR ;
FARRANT, RD ;
RAHR, E ;
BEDDELL, CR ;
LINDON, JC .
JOURNAL OF PHARMACEUTICAL AND BIOMEDICAL ANALYSIS, 1994, 12 (10) :1215-1225
[6]  
Vogels JTWE, 1996, J CHEMOMETR, V10, P425, DOI 10.1002/(SICI)1099-128X(199609)10:5/6<425::AID-CEM442>3.0.CO
[7]  
2-S