Scanning acoustic microscopy with vector contrast

被引：12

作者：

Grill, W

Hillmann, K

Kim, TJ

Lenkeit, O

Ndop, J

Schubert, M

机构：

[1] Univ Leipzig, Inst Expt Phys 2, D-04103 Leipzig, Germany

[2] Forschungszentrum Med Tech & Biotechnol EV, D-99947 Bad Langensalza, Germany

来源：

PHYSICA B | 1999年 / 263卷

关键词：

scanning acoustic microscopy; phase contrast; maximum amplitude; volume imaging; acoustic near field microscopy; SAM; PSAM;

D O I：

10.1016/S0921-4526(98)01478-1

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

Based on high resolution vector contrast involving the simultaneous detection of phase and amplitude a variety of novel schemes for scanning acoustic microscopy are presented. This includes high resolution topography of sample surfaces in the reflection mode, volume imaging by three dimensional scanning, holographic imaging of the transport properties of ultrasonic waves by surface focused transmission microscopy, thermal imaging by differential phase contrast, and acoustic near field microscopy performed in reflection at 1.2 GHz. (C) 1999 Elsevier Science B.V. All rights reserved.

引用

页码：553 / 558

页数：6