Range-extended EXAFS at the L edge of rare earths using high-energy-resolution fluorescence detection:: A study of La in LaOCl -: art. no. 014117

被引:49
作者
Glatzel, P
de Groot, FMF
Manoilova, O
Grandjean, D
Weckhuysen, BM
Bergmann, U
Barrea, R
机构
[1] European Synchrotron Radiat Facil, F-38043 Grenoble, France
[2] Univ Utrecht, Dept Inorgan Chem & Catalysis, Debye Inst, NL-3584 CA Utrecht, Netherlands
[3] Stanford Synchrotron Radiat Lab, Stanford, CA 94309 USA
[4] Argonne Natl Lab, BioCAT, Adv Photon Source, Argonne, IL 60439 USA
关键词
D O I
10.1103/PhysRevB.72.014117
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We present extended x-ray absorption fine structure (EXAFS) data at the La L-2 edge in LaOCl that were recorded on the L beta(1) fluorescence line with an analyzer energy bandwidth of 1.3 eV. We show that by taking advantage of the high-energy-resolution fluorescence detection (HERFD) it is possible to extend the energy range for L-2 EXAFS analysis beyond the L-1 edge if the sample is optically thin. The arguments presented here generally apply to fluorescence-detected absorption spectroscopy if the fluorescence lines are sufficiently separated in energy. Calculations using an atomic multiplet model show that intensity due to 2p4d multiple-electron excitations is reduced in HERFD spectra. The technique has the potential of considerably improving EXAFS analyses at low energies (< 10 keV) when absorption edges lie within a few hundred electron volts.
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