Surface profiles from polarization measurements in neutron reflectometry

被引:14
作者
Lipperheide, R
Kasper, J
Leeb, H
机构
[1] Hahn Meitner Inst Kernforsch Berlin GmbH, D-14091 Berlin, Germany
[2] Free Univ Berlin, D-14091 Berlin, Germany
[3] Vienna Tech Univ, Inst Kernphys, A-1040 Vienna, Austria
来源
PHYSICA B | 1998年 / 248卷
关键词
neutron specular reflection; phase problem; surface profiles; inversion;
D O I
10.1016/S0921-4526(98)00266-X
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
A method is proposed for the determination of the phase of the reflection coefficient, which can be applied even in the regime of total reflection. It exploits the interference of the spin components of a polarized neutron beam in the presence of a magnetic field and requires the measurement of polarizations. The results of a simulated determination of the complex reflection coefficient are used as input for the calculation of the surface profile by inversion. (C) 1998 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:366 / 371
页数:6
相关论文
共 28 条
[1]   Graded-index profiles by inversion with Lloyd's mirage [J].
Allen, LJ ;
Lipperheide, R .
APPLIED OPTICS, 1996, 35 (19) :3496-3499
[2]   REFRACTIVE-INDEX-PROFILE DETERMINATIONS BY USING LLYOD MIRAGE [J].
ALLMAN, BE ;
KLEIN, AG ;
NUGENT, KA ;
OPAT, GI .
APPLIED OPTICS, 1994, 33 (10) :1806-1811
[3]  
Allman BE, 1993, EUR J PHYS, V14, P272
[4]  
[Anonymous], 1989, INVERSE PROBLEMS QUA
[5]   PHASE DETERMINATION IN X-RAY AND NEUTRON REFLECTIVITY USING LOGARITHMIC DISPERSION-RELATIONS [J].
CLINTON, WL .
PHYSICAL REVIEW B, 1993, 48 (01) :1-5
[6]   Toward the solution of the inverse problem in neutron reflectometry [J].
deHaan, VO ;
vanWell, AA ;
Sacks, PE ;
Adenwalla, S ;
Felcher, GP .
PHYSICA B, 1996, 221 (1-4) :524-532
[7]   RETRIEVAL OF PHASE INFORMATION IN NEUTRON REFLECTOMETRY [J].
DEHAAN, VO ;
VANWELL, AA ;
ADENWALLA, S ;
FELCHER, GP .
PHYSICAL REVIEW B, 1995, 52 (15) :10831-10833
[8]  
DOZIER WD, 1991, B AM PHYS SOC, V36, P772
[9]  
FIEDELDEY H, 1991, PHYS LETT A, V170, P347
[10]   NEUTRON REFLECTION INTERFEROMETRY - PHYSICAL PRINCIPLES OF SURFACE-ANALYSIS WITH PHASE INFORMATION [J].
GUDKOV, VP ;
OPAT, GI ;
KLEIN, AG .
JOURNAL OF PHYSICS-CONDENSED MATTER, 1993, 5 (49) :9013-9024